Device technology has great importance today. Optoelectronic devices are used
in many fields such as medicine, lighting, and communication at any time. Thin-film surface
profile knowledge is needed to develop optoelectronic devices in these fields. Hence, various
surface profile determination studies and devices such as Scanning Electron Microscope
(SEM), Atomic Force Microscope (AFM), optical methods, etc. have been developed. Optical
methods are preferred more than other methods because they are economical and useful. In
this work, a theoretically created surface profile was analyzed by a signal-analyzing method.
The resolution value of the Morlet wavelet is equal to . This value represents that the Morlet
wavelet has the best resolution. Hence, the Morlet wavelet is preferred in this work. The
Morlet wavelet algorithm was adopted to analyze a surface profile of a thin film. The
simulated thin film surface was analyzed by the Morlet wavelet algorithm and the average
difference between the input and analysis phases was calculated as 9.6210 -3. ORCID NO: 0000-0003-1705-9829
Anahtar Kelimeler: Thin film, surface profile, Morlet wavelet.